NanoMEGAS

Novel Automated Strain Mapping Solution for TEM/STEM (Patent pending) based on nanobeam precession diffraction patterns and STEM reference image acquisition. Precision up to 0.02% (200kV FEG) with spatial resolution < 2 nm (FEG TEM).

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Novel Automated Strain Mapping Solution for TEM/STEM (Patent pending) based on nanobeam precession diffraction patterns and STEM reference image acquisition. Precision up to 0.02% (200kV FEG) with spatial resolution < 2 nm (FEG TEM).

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