GenISys (Germany)

InSPEC is a new SEM metrology and inspection solution connecting to a SEM through digital and analog interfaces providing full control of beam shaping, stage navigation, and image scanning. Advanced multi-chip jobs become possible with the integrated workflow of scanning, contour detection, corrections, and data processing. InSPEC is the upgrade kit for your SEM to convert it into a versatile and sophisticated metrology tool for supporting nanofabrication of novel patterns and devices.

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InSPEC is a new SEM metrology and inspection solution connecting to a SEM through digital and analog interfaces providing full control of beam shaping, stage navigation, and image scanning. Advanced multi-chip jobs become possible with the integrated workflow of scanning, contour detection, corrections, and data processing. InSPEC is the upgrade kit for your SEM to convert it into a versatile and sophisticated metrology tool for supporting nanofabrication of novel patterns and devices.

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Country (Wikidata; date unspecified)

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Germany

Wikidata Q97040160 property P17. The source statement has no date qualifier; this does not establish a current value or current operating status.

Deterministically projected from an identity-matched Wikidata record. Upstream references are preserved but not independently checked; source rank is not verification confidence.

Rule checked 2026-10-17 · Review due 2027-01-15 · Version 1

Inception (Wikidata)

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2005

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Official website (Wikidata; date unspecified)

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https://www.genisys-gmbh.com/

Wikidata Q97040160 property P856. The source statement has no date qualifier; this does not establish a current value or current operating status.

Deterministically projected from an identity-matched Wikidata record. Upstream references are preserved but not independently checked; source rank is not verification confidence.

Rule checked 2026-10-17 · Review due 2027-01-15 · Version 1

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